Intranodal Proton Hopping in Defect-Free UiO-66: Evidence from Operando NMR and ML-Accelerated Enhanced Sampling

J. Z. Hu, Y. Xu, J. S. García Sánchez, Y. Ji, J. Schmid, Y. Jin, D. J. Bazak, S. Kim, R. Kishan Motkuri, H. Wang, J. T. Hupp, K. Glusac, J. A. Lercher, J. J. de Pablo, and K. T. Mueller, Intranodal Proton Hopping in Defect-Free UiO-66: Evidence from Operando NMR and ML-Accelerated Enhanced Sampling, ChemRxiv, 2025. DOI: 10.26434/chemrxiv-2025-2fln9